Abstract: Aiming at the posterior parameter computation difficulty of Bayes method in engineering application, this paper proposed a novelty method for Bayesian reliability assessment of electronic equipment. The prior distribution of failure rate is built according to the engineering experiences, based on the prior distribution, this approach allows constructing the discrete joint prior distribution of lifetime distribution parameters through random sampling, combined with the censoring data of life test, random sample is adopted again to obtain the discrete joint posterior distribution of the parameters. A practical example is given as an illustration, the process is compared with the other approaches. Result shows that, this approach can simplify much computation in practical applications as well as ensure the accuracy; it has great values for electronic equipment reliability assessment.