Built-in Self-test Design of the Embedded ROM and SRAM Based on the IEEE 1500 Standard

Embedded memory in SOC occupied area ratio increasing,also presented new challenges for embedded memory test technology.IEEE 1500 standard for IP core providers and integrators to develop a standard test interface.This paper designs a test wrapper and compatibility controller for embedded memory.This paper validates the SRAM and ROM as test object.And the test results show that the system can accurately detect the existence of the fault of the embedded memory.